Advanced Semiconductor Detectors and Materials
335 works
Distribution of Defects in InAs<sub>1-x-y</sub>Sb<sub>x</sub>P<sub>y</sub>-InAs DHs
T. S. Argunova, R. N. Kyutt, B. A. Matveev +3
ArticleAdvanced Semiconductor Detectors and MaterialsDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena19910 citationsABIX-Ray Diffractometry and Topography of CdHgTe Bulk Crystals and CdHgTe-CdTe Epitaxial Structures
В. В. Ратников, T. S. Argunova, K.E. Mironov +1
ArticleAdvanced Semiconductor Detectors and MaterialsDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena19910 citationsABI