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Lasing in the vertical direction in quantum-size InGaN/GaN multilayer heterostructures

A. V. SakharovA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgW. V. LundinA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgV. A. SemenovA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgA. UsikovA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgN. N. LedentsovA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgA. F. Tsatsul’nikovA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg,М. В. БайдаковаA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg
Technical Physics Lettersjournal1999en
ABI

Аннотация

Lasing is discovered in the direction perpendicular to the surface in quantum-size InGaN/GaN multilayer heterostructures grown by vapor-phase epitaxy. At high excitation densities one of the modes in the luminescence spectrum, which is modulated by modes of the Fabry-Pérot cavity formed by the GaN/air and GaN/sapphire-substrate interfaces, is sharply amplified and begins to dominate the spectrum. The dependence of the luminescence intensity on pump density has a clearly expressed threshold character. The threshold excitation density in the vertical direction is 5–6 times greater than the stimulated-emission threshold for observation from an end surface of the structure. The gain coefficient in the active region at the threshold for surface-emitting lasing is estimated as 2×105 cm−1. The interaction between the cavity modes and the gain spectrum is detected in the form of displacement (by up to 2.6 nm) of modes on the short-wavelength edge of the luminescence spectrum toward higher photon nergies. The characteristic temperature (T 0) measured in the range from 16 to 120 K is 480 K. At higher temperatures T 0 K.

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