Ushbu ishga iqtibos qilgan ishlar

3 ta ish

Ish: Effect of oxide-trapped charge on the anomalous drain avalanche hot carrier degradation of a SiO2 dielectric nMOSFET

1. Lateral Capacitance–Voltage Method of NanoMOSFET for Detecting the Hot Carrier Injection

   A. É. Atamuratov, Ahmed Yusupov, Zamira Atamuratova +2

   MaqolaSemiconductor materials and devicesApplied Sciences20203 iqtibos

   ABIABI:AkademIndex/openalex/2020.article.000900

2. Capacitance Method for Identifying Degradation due to Electrical Stress in MOSFETs

   Zamira Atamuratova, Ahmed Yusupov, Jean Chamberlain Chedjou +1

   MaqolaSemiconductor materials and devicese-Journal of Surface Science and Nanotechnology20220 iqtibos

   ABIABI:AkademIndex/openalex/2022.article.006400

3. Capacitance-Voltage Method for Detecting the local oxide trapped charge in SOI FinFET

   A.E. Abdikarimov, Mirzabahrom Foziljonov, И. Н. Каримов

   MaqolaSemiconductor materials and devices20220 iqtibos

   ABIABI:AkademIndex/openalex/2022.article.011220