Advanced Semiconductor Detectors and Materials
Работ: 335
The Influence of γ-Irradiation on the Current Transport Mechanism upon the Application of Reverse Bias to the Al/p-CdTe/Mo Structure
A. S. Achilov, R. R. Kabulov, O. A. Abdulkhaev +4
СтатьяAdvanced Semiconductor Detectors and MaterialsSurface Engineering and Applied Electrochemistry2026Цитирований: 0ABIRole of Deep Defect States in Anomalous Photovoltage Relaxation of Polycrystalline Silver-Doped Cadmium Telluride Thin Films
O R Nurmatov, Dilmuhammad Kh. Tolaboyev, Javokhirbek A. Akhmadaliyev +5
СтатьяChalcogenide Semiconductor Thin FilmsInformacije MIDEM - Journal of Microelectronics Electronic Components and Materials2026Цитирований: 0ABI