Работы, цитирующие эту работу

Работ: 3

Работа: Special Applications

1. Electronic structure and optical properties of CaF2 films under low energy Ba+ ion-implantation combined with annealing

   Б. Е. Умирзаков, T.S. Pugacheva, A.T. Tashatov +1

   СтатьяInorganic Fluorides and Related CompoundsNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2000Цитирований: 16

   ABIABI:AkademIndex/openalex/2026.other.203259

2. Structure of МеSi Silicide Films (Me: Li, Rb, K and Cs) According to Electron Microscopy Data and the Diffraction of Slow Electrons

   M.T. Normuradov, A. S. Risbaev, J. B. Khujaniyozov +1

   СтатьяSemiconductor materials and interfacesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2020Цитирований: 2

   ABIABI:AkademIndex/openalex/2026.other.213643

3. Study of the Distribution Profile for Nickel Implanted in Silicon and the Effect of Annealing on the Structure

   Б. Э. Эгамбердиев, A. A. Akbarov

   СтатьяSilicon and Solar Cell TechnologiesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2021Цитирований: 2

   ABIABI:AkademIndex/openalex/2026.other.392899