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23 та иш

Иш: Raman Spectoroscopy of Silicon Single Crystals, Doped with Palladium and Irradiated by GammaRays

  1. Iron contamination in silicon technology

    A. A. Istratov, H. Hieslmair, E. R. Weber

    Мақола20005 иқтибос
    ABI
  2. Determining the material structure of microcrystalline silicon from Raman spectra

    C. Smit, R.A.C.M.M. van Swaaij, H. Donker +3

    Мақола20034 иқтибос
    ABI
  3. Raman spectroscopy of PtSi formation at the Pt/Si(100) interface

    J. C. Tsang, Y. Yokota, R. Matz +1

    Мақола19844 иқтибос
    ABI
  4. One and two-phonon Raman scattering from nanostructured silicon

    Igor Iatsunskyi, Grzegorz Nowaczyk, Stefan Jurga +3

    Мақола20153 иқтибос
    ABI
  5. Resonant Raman scattering of a single layer of Si nanocrystals on a silicon substrate

    A. Wellner, Vincent Paillard, H. Coffin +2

    Мақола20043 иқтибос
    ABI
  6. Critical-point analysis of the two-phonon Raman spectrum of silicon

    K. Uchinokura, Tomoyuki Sekine, E. Matsuura

    Мақола19743 иқтибос
    ABI
  7. The optical properties of luminescence centres in silicon

    Gordon Davies

    Мақола19893 иқтибос
    ABI
  8. Radiation Damage by Heavy Ions in Silicon and Silicon Carbide Detectors

    C. Altana, L. Calcagno, C. Ciampi +8

    Мақола20232 иқтибос
    ABI
  9. INFLUENCE OF ALPHA PARTICLES ON TECHNOLOGICAL IMPURITIES IN SILICON DOPED WITH PLATINUM

    Sharifa B. Utamuradova

    Мақола20252 иқтибос
    ABI
  10. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI
  11. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI
  12. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI
  13. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI
  14. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI
  15. Сарлавҳасиз

    Бошқа1 иқтибос
    ABI