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Иш: Raman Spectoroscopy of Silicon Single Crystals, Doped with Palladium and Irradiated by GammaRays
Iron contamination in silicon technology
A. A. Istratov, H. Hieslmair, E. R. Weber
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J. C. Tsang, Y. Yokota, R. Matz +1
Мақола19844 иқтибосABIOne and two-phonon Raman scattering from nanostructured silicon
Igor Iatsunskyi, Grzegorz Nowaczyk, Stefan Jurga +3
Мақола20153 иқтибосABIRadiation Damage by Heavy Ions in Silicon and Silicon Carbide Detectors
C. Altana, L. Calcagno, C. Ciampi +8
Мақола20232 иқтибосABI