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Работы, цитирующие эту работу

Работ: 9

Работа: Obtaining higher manganese silicide films with high thermoelectric properties

  1. Formation of thin Crsi <sub>2</sub> films by the solid-phase ion-plasma method and their thermoelectric properties

    I. R. Bekpulatov, Gunel Imanova, Б. Е. Умирзаков +5

    СтатьяAdvanced Thermoelectric Materials and DevicesMaterials Research Innovations2024Цитирований: 9
    ABI

  2. The solid-phase ion-plasma method and thermoelectric properties of thin CrSi2 films

    I. R. Bekpulatov, Gunel Imanova, S. H. Jabarov +8

    СтатьяAdvanced Thermoelectric Materials and DevicesJournal of Materials Science Materials in Electronics2024Цитирований: 6
    ABI

  3. Electrophysical and thermoelectric properties and crystal structure of the formed Mn4Si7 thin vacuum coatings

    Б.Д. Игамов, Gunel Imanova, Vera Loboda +3

    СтатьяChalcogenide Semiconductor Thin FilmsOptical Materials X2024Цитирований: 4
    ABI

  4. Obtaining and studying the composition, structure and properties of nanophases and nanolayers of CoSi <sub>2</sub>

    Б. Е. Умирзаков, Zh. M. Jumayev, I. R. Bekpulatov +3

    СтатьяSemiconductor materials and interfacesMaterials Research Innovations2024Цитирований: 3
    ABI

  5. Analysis of the change in the composition of the CdTe surface upon implantation of О_2^+ ions and subsequent annealing

    A.A. Abduvaitov, Gunel Imanova

    СтатьяAdvanced Semiconductor Detectors and MaterialsAdvanced Physical Research2024Цитирований: 2
    ABI

  6. Selecting a Target for Obtaining Films of Higher Manganese Silicide Using Magnetron Sputtering

    М. S. Lukasov, Н. А. Архарова, Andrey Orekhov +2

    СтатьяSemiconductor materials and interfacesCrystallography Reports2024Цитирований: 0
    ABI

  7. Selecting a target for obtaining films of higher manganese silicide using magnetron sputtering

    М. S. Lukasov, Н. А. Архарова, Anton S. Orekhov +2

    СтатьяSemiconductor materials and interfacesКристаллография2024Цитирований: 0
    ABI

  8. Temperature dependence changes in the physical and chemical properties of ZnO detected by powder diffractometry

    U.Kh. Kholikov, Ш. Т. Хожиев, И.О. Косимов +7

    СтатьяZnO doping and propertiesOptics Communications2025Цитирований: 0
    ABI

  9. Study of the temperature dependence of the electrophysical and crystal structure of a thin coating of manganese silicide

    B.D. Igamov, A.I. Kamardin, I.R. Bekpulatov +1

    СтатьяSemiconductor materials and interfacesMaterials Today Communications2026Цитирований: 0
    ABI