Э. У. Арзикулов
Работ: 25
Samarkand State University, Boulevard Universitetski, Samarkand, 140104, Republic of Uzbekistan
High-resolution X-ray photoelectron spectroscopy and characteristic electron-energy loss spectroscopy of the electronic structure of phosphorus-implanted silicon and quantum dots of silicon dioxide with silicon impurities
O. K. Kuvandikov, Э. У. Арзикулов, А. И. Ковалев +1
СтатьяSilicon Nanostructures and PhotoluminescenceJournal of Communications Technology and Electronics2007Цитирований: 0ABINumerical prediction of the tensile strength of composite T-joints considering multiple failure criteria and damage degradation models
Xiaoqiang Wang, Rui Zhang, Chengkun Ma +7
СтатьяStructural Analysis and OptimizationInternational Journal of Computational Materials Science and Engineering2025Цитирований: 0ABI