← Назад к работе
Работы, цитирующие эту работу
Работ: 9
Работа: X-ray diffraction diagnostics methods as applied to highly doped semiconductor single crystals
Features of the Properties of the Surface of (GaAs)1 – x – у(Ge2)x(ZnSe)y Semiconductor Solid Solution with ZnSe Quantum Dots
С. З. Зайнабидинов, А. С. Саидов, Akramjon Y. Boboev +1
СтатьяSemiconductor Quantum Structures and DevicesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2021Цитирований: 4ABIStructural Peculiarities of the (ZnSe)1 – x – y(Ge2)x(GaAs1 – δBiδ)y Solid Solution with Various Nanoinclusions
С. З. Зайнабидинов, Sharifa B. Utamuradova, Akramjon Y. Boboev
СтатьяChalcogenide Semiconductor Thin FilmsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2022Цитирований: 4ABI