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Работы, на которые ссылается эта работа

Работ: 33

Работа: Controlling the Low-temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

  1. Procedure for determining defects in sputtered clusters of ionic crystals

    Utkirjon Sharopov, Б.Г. Атабаев, R. Djabbarganov +2

    СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2016Цитирований: 14
    ABI

  2. Energy Threshold of the Atomic and Cluster Sputtering of Some Elements under Bombardment with Cs, Rb, and Na Ions

    R. Djabbarganov, Б.Г. Атабаев, З. А. Исаханов +1

    СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2019Цитирований: 14
    ABI

  3. Kinetics of aggregations of F 2, F 3, X, and colloid centers in LiF/Si(111) films upon low-temperature annealing

    Utkirjon Sharopov, Б.Г. Атабаев, R. Djabberganov +1

    СтатьяElectron and X-Ray Spectroscopy TechniquesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2013Цитирований: 11
    ABI

  4. Defect Formation on the Surface of ZnO Using Low-Energy Electrons

    Utkirjon Sharopov, Б.Г. Атабаев, R. Djabbarganov

    СтатьяZnO doping and propertiesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2020Цитирований: 11
    ABI

  5. Computer Simulation of Scattering Xe<sup>+</sup> Ions from InP(001)❬110❭ Surface at Grazing Incidence

    Karimov Mukhtorjon Karimberganovich, Matchоnov Khusniddin Jamoladdinovich, Otaboeva Kamola Uchkun qizi +1

    СтатьяIon-surface interactions and analysise-Journal of Surface Science and Nanotechnology2019Цитирований: 11
    ABI

  6. Orientation Effects during Scattering of Ar+ Ions from the InP(001) Surface under Grazing-Angle Ion Bombardment

    Uchkun Kutliev, М. K. Kаrimov, Mexroj Otaboev

    СтатьяIon-surface interactions and analysisInorganic Materials Applied Research2020Цитирований: 10
    ABI

  7. Total current spectroscopy

    S. A. Komolov, L.T. Chadderton

    Статья1979Цитирований: 9
    ABI

  8. Modification of the Surface Properties of Free Si–Cu Films by Implantation of Active Metal Ions

    З. А. Исаханов, И.О. Косимов, Б. Е. Умирзаков +1

    СтатьяSemiconductor materials and interfacesTechnical Physics2020Цитирований: 8
    ABI

  9. Low Energy Ar<sup>+</sup> Ion Scattering on InGaP(001) Surface

    Karimov Mukhtorjon Karimberganovich, Kutliev Uchkun Otoboyevich, Ismailov Shavkat Ko'ziyevich +1

    СтатьяIon-surface interactions and analysise-Journal of Surface Science and Nanotechnology2020Цитирований: 7
    ABI

  10. Angular Distributions of Scattered Ne and Ar Ions at the Grazing Incidence on the InGaP (001) 110 Surface

    М. K. Kаrimov, Uchkun Kutliev, Kamola Otabaeva +1

    СтатьяRadiation Detection and Scintillator TechnologiesJournal of Nano- and Electronic Physics2020Цитирований: 6
    ABI

  11. Mechanism of Aggregation Colloid Centers on Surface Ionic Crystals

    Utkirjon Sharopov, Б.Г. Атабаев, R. Djabbarganov +1

    Глава2016Цитирований: 6
    ABI

  12. Toward the Understanding of Selective Si Nano-Oxidation by Atomic Scale Simulations

    Umedjon Khalilov, Annemie Bogaerts, Erik C. Neyts

    Статья2017Цитирований: 6
    ABI

  13. Target current spectroscopy of the alkali halides KCl, CsCl and KBr

    E.K. Alidjanov, Б.Г. Атабаев, S. Gaipov +1

    СтатьяElectron and X-Ray Spectroscopy TechniquesThin Solid Films1994Цитирований: 6
    ABI

  14. Graphene and two-dimensional materials for silicon technology

    Deji Akinwande, Cedric Huyghebaert, Ching-Hua Wang +5

    Обзорная статья2019Цитирований: 3
    ABI

  15. Silicon Planar Processing and Photolithography

    Christo Papadopoulos

    Глава2016Цитирований: 3
    ABI

  16. Springer Handbook of Electronic and Photonic Materials

    Safa Kasap, P. Capper

    Книга2007Цитирований: 3
    ABI

  17. Quantum-dimensional structures produced by ion implantation

    Н. Н. Герасименко, Yu. N. Parhomenko, V.Yu. Troitskiy +4

    Статья2003Цитирований: 3
    ABI

  18. Evaluation of the Topographical Surface Changes of Silicon Wafers after Annealing and Plasma Cleaning

    Sebastian Stach, Ştefan Ţălu, Rashid Dallaev +3

    Статья2019Цитирований: 3
    ABI

  19. Adsorption and Desorption

    S. Roy Morrison

    Глава1990Цитирований: 2
    ABI

  20. Techniques to Obtain Atomically Clean Surfaces

    J. Verhoeven

    Глава1979Цитирований: 2
    ABI

  21. Generation of clean surfaces in high vacuum

    Richard W. Roberts

    Статья1963Цитирований: 2
    ABI

  22. From crater eruption to surface purification of raw silicon: A treatment by pulsed electron beam

    Yunying Gao, Ying Qin, Chuang Dong +1

    Статья2014Цитирований: 2
    ABI

  23. Nanopurification of silicon from 84% to 99.999% purity with a simple and scalable process

    Linqi Zong, Bin Zhu, Zhenda Lu +7

    Статья2015Цитирований: 2
    ABI

  24. Novel and efficient purification of silicon through ultrasonic-Cu catalyzed chemical leaching

    Fengshuo Xi, Hongqi Cui, Zhao Zhang +7

    Статья2019Цитирований: 2
    ABI

  25. Formation of Nanodimensional SiO2 Films on the Surface of a Free Si/Cu Film System by $${\text{O}}_{2}^{ + }$$ Ion Implantation

    Б. Е. Умирзаков, М. К. Рузибаева, З. А. Исаханов +1

    СтатьяIon-surface interactions and analysisTechnical Physics2019Цитирований: 2
    ABI