GaN-based semiconductor devices and materials
Работ: 71
Energy and Temperature Dependence of the Secondary Ion Emission of GaN/SiC Clusters under Cesium-Ion Bombardment
Б.Г. Атабаев, R. Djabbarganov, M. Kh. Akhmadjanova +1
СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2021Цитирований: 0ABI