Б. Е. Умирзаков
96 та иш
Karimov Tashkent State Technical University, 100095, Tashkent, Uzbekistan
Study of the Influence of Implanted Atoms on the Coefficients of the Sputtering of Silicon and Silicon with a Thin Oxide Film
Д. А. Ташмухамедова, M. B. Yusupjanova, A. K. Tashatov +1
МақолаIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20185 иқтибосABIDetermination of the Kinetic Characteristics of the Thermal Desorption and Heterogeneous Reaction of Dissociation of Morphine Molecules on the Surface of Oxidized Tungsten
G. T. Rakhmanov, Б. Е. Умирзаков, Dilshadbek T. Usmanov
МақолаChemical Thermodynamics and Molecular StructureJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20233 иқтибосABIStudy of the dependence of the degree of disordering of the surface layers of Si(111) and Ge(111) single crystals upon bombardment with low-energy ions
Б. Е. Умирзаков, I. R. Bekpulatov, Gunel Imanova +2
МақолаIon-surface interactions and analysisEurasian journal of physics and functional materials20232 иқтибосABI