Integrated Circuits and Semiconductor Failure Analysis
142 works
POLARIZATION DEPENDENCE OF SINGLE-PHOTON INTERBAND LINEAR CIRCULAR DICROISM IN A3B5 SEMICONDUCTORS
Rasulov Rustam Yavkachovich, Isomiddinova Umida Mamurjonova, Kasimov Forrukh Kasimovich +1
ArticleIntegrated Circuits and Semiconductor Failure AnalysisAustrian Journal of Technical and Natural Sciences20240 citationsABIEffect of $${\text{O}}_{2}^{ + }$$ Ion Implantation on the Elemental and Chemical Composition of the Si(111) Surface
G. Kh. Allayarova, Б. Е. Умирзаков, A. K. Tashatov
ArticleIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20240 citationsABIThe Effect of Atmospheric Oxide Thermodesorption on Negative-Ion Atomic and Cluster Sputtering of Silicon Single Crystal by Cesium Ions
Б.Г. Атабаев, R. Djabbarganov, A. S. Khalmatov +2
ArticleIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20240 citationsABIEffect of the Angle of Incidence of Low-Energy Ar+ Ion Beams on the Composition and Structure of the GaAs Surface
Д. А. Ташмухамедова, Б. Е. Умирзаков, Z. A. Tursunmetova
ArticleIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20240 citationsABI