Integrated Circuits and Semiconductor Failure Analysis
142 works
The emission of atomic and molecular ions under single and multiple-charged rare gas ion bombardment of LiF, KCl, SiC
Б.Г. Атабаев, Sh.S. Radjabov, M.Kh. Akhmadzhanova
ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms19951 citationsABIEffect of high-dose low-energy reactive-ion implantation on cold cathode properties
Flyura Djurabekova, Б. Е. Умирзаков, F. F. Umarov +1
ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20031 citationsABIThe radiation stimulated diffusion role in high dose, low energy, high temperature ion implantation
S.H. Valiev, T.S. Pugacheva, F.G. Jurabekova +2
ArticleSilicon and Solar Cell TechnologiesNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms19971 citationsABIPerformance Characteristics of Fiber Optical Lines and Diagnostic Techniques for Optical Fiber Cable
Abdulaziz Nazarov, Bobir Ochilov, Mirkomil Khasanov
ArticleIntegrated Circuits and Semiconductor Failure Analysis2021 International Conference on Information Science and Communications Technologies (ICISCT)20211 citationsABI