Semiconductor materials and devices
Работ: 277
Effect of the Angle of Incidence of Low-Energy Ar+ Ion Beams on the Composition and Structure of the GaAs Surface
Д. А. Ташмухамедова, Б. Е. Умирзаков, Z. A. Tursunmetova
СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2024Цитирований: 0ABI