Перейти к основному содержанию
AkademIndex

Продукты

Для разработчиков

AkademBaseОткрытый API экосистемы

Surface and Thin Film Phenomena

Работ: 232

  1. Semiclassical theory of electronic states in multilayer semiconductors. Part 2

    Rustam Yavkachovich Rasulov, Makhliyo A. Mamatova, F Qosimov

    СтатьяSurface and Thin Film PhenomenaJournal of Physics Conference Series2022Цитирований: 2
    ABI

  2. Obtaining Thin Films from Semiconductor Compounds and Their X-Ray Analysis

    K.T. Dovranov, Maksim Vinnichenko, Asilbek Kodirov +6

    СтатьяSurface and Thin Film Phenomena2024Цитирований: 2
    ABI

  3. On the growth of higher manganese silicide films on silicon

    Andrey Orekhov, T. S. Kamilov, Abdumalik Gaibov +2

    СтатьяSemiconductor materials and interfacesTechnical Physics2010Цитирований: 2
    ABI

  4. Structure of МеSi Silicide Films (Me: Li, Rb, K and Cs) According to Electron Microscopy Data and the Diffraction of Slow Electrons

    M.T. Normuradov, A. S. Risbaev, J. B. Khujaniyozov +1

    СтатьяSemiconductor materials and interfacesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2020Цитирований: 2
    ABI

  5. Theoretical and experimental study of plasmon oscillation dispersion in Si and Ge crystals

    З. А. Исаханов, Б. Е. Умирзаков, Gunel Imanova

    СтатьяSurface and Thin Film PhenomenaOptical Materials X2024Цитирований: 2
    ABI

  6. Influence of Isotropic Pressure on the Current–Voltage Characteristics of Surface-Barrier Diodes Sb–p-Si〈Mn〉–Au

    С. З. Зайнабидинов, I. G. Tursunov, О. Химматкулов

    СтатьяSemiconductor materials and interfacesSemiconductors2018Цитирований: 2
    ABI

  7. Obtaining manganese silicide films on a silicon substrate by the diffusion method

    N. F. Zikrillayev, M. M. Shoabdurahimova, T. Kamilov +4

    СтатьяSemiconductor materials and interfacesPhysical Sciences and Technology2022Цитирований: 2
    ABI

  8. Thin silicide films: producing and properties

    А.С. Рысбаев, S. S. Nasriddinov, Yu. Yu. Yuldashev +4

    СтатьяSemiconductor materials and interfaces2004Цитирований: 2
    ABI

  9. Eddy currents in the p–n junction in a microwave field

    S. H. Shamirzaev, G. Gulyamov, М. Г. Дадамирзаев +1

    СтатьяSurface and Thin Film PhenomenaSemiconductors2009Цитирований: 2
    ABI

  10. Two-site model for a small polaron: Mass renormalization and optical conductivity

    Bakhrom Yavidov

    СтатьяPhysics of Superconductivity and MagnetismJournal of Experimental and Theoretical Physics2009Цитирований: 2
    ABI

  11. Investigation of Current Characteristics of Thin-Film Structures Based on GaP under the Action of an Electron Beam

    V. M. Rubinov, M. Tuychiev

    СтатьяChemical and Physical Properties of Materialsphysica status solidi (a)1982Цитирований: 1
    ABI

  12. Properties of precisely compensated semiconductors

    Smagul Karazhanov

    СтатьяSilicon and Solar Cell TechnologiesSemiconductors2000Цитирований: 1
    ABI

  13. Semiclassical theory of electronic states in multilayer semiconductors. Part 1

    Rustam Yavkachovich Rasulov, Makhliyo A. Mamatova, F Qosimov

    СтатьяSurface and Thin Film PhenomenaJournal of Physics Conference Series2022Цитирований: 1
    ABI

  14. Ordering of europium magnetic domains in silicon at room temperature

    G. H. Mavlonov, С. Б. Исамов, S. Koveshnikov +4

    СтатьяMagnetic properties of thin filmsIndian Journal of Physics2024Цитирований: 1
    ABI

  15. Study the current-voltage characteristics of the atoms cluster microstructure of nickel-silicon

    М. К. Бахадырханов, Б. А. Абдурахманов, Eh.B. Saitov

    СтатьяAdvanced Materials Characterization Techniques2013Цитирований: 1
    ABI

  16. Low-temperature diffusion of lithium in silicon-germanium solid solutions

    I. G. Atabaev, N. A. Matchanov, É. N. Bakhranov

    СтатьяSemiconductor materials and interfacesPhysics of the Solid State2001Цитирований: 1
    ABI

  17. Analysis of defect structures in single crystals by ion scattering and channelling

    A. M. Rasulov

    СтатьяIon-surface interactions and analysis2007Цитирований: 1
    ABI

  18. Investigation of the influence of external effects on the behavior of gold impurity in silicon

    С. З. Зайнабидинов, О. О. Маматкаримов, I. G. Tursunov +1

    СтатьяSemiconductor materials and interfacesSemiconductors2000Цитирований: 1
    ABI

  19. Non-conventional tight-binding method for simulation of atomic clusters and solids

    Z. M. Khakimov

    СтатьяAdvanced Chemical Physics StudiesJournal of Physics Conference Series2006Цитирований: 1
    ABI

  20. Photoelectric Properties of MnSi Films

    К. Адамбаев, А. Yusupov, Komiljon Yakubov

    СтатьяSemiconductor materials and interfacesInorganic Materials2001Цитирований: 1
    ABI

  21. INVESTIGATION OF THE FREQUENCY DEPENDENCE OF THE RESISTANCE OF PbTe FILMS

    T. Akhmedov, S.M. Otazhonov, M.M. Khalilov

    СтатьяAdvanced Thermoelectric Materials and DevicesInternational Journal of Advance Scientific Research2022Цитирований: 1
    ABI

  22. UV photoelectron spectra of Nb and Mo single-crystal surfaces

    I. Buribayev, N. A. Nurmatov

    СтатьяElectron and X-Ray Spectroscopy TechniquesJournal of Electron Spectroscopy and Related Phenomena1994Цитирований: 1
    ABI

  23. The thermal expansion of disilicides of some transition metals

    L.F. Verkhorobin, N.N. Matyushenko

    СтатьяSemiconductor materials and interfacesPowder Metallurgy and Metal Ceramics1964Цитирований: 0
    ABI

  24. A Scanning Electron Microscope Study of In[sub 1−x]Ga[sub x]P

    V. A. Voronin, W. D. JUN. STEWART, Grayson W. Marshall +3

    СтатьяSurface and Thin Film PhenomenaJournal of The Electrochemical Society1974Цитирований: 0
    ABI

  25. Low-temperature yield stress anomaly in single-crystal silver

    A. I. Landau, T. A. Parkhomenko, V. V. Pustovalov

    СтатьяSurface and Thin Film PhenomenaSoviet Journal of Low Temperature Physics1975Цитирований: 0
    ABI